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Power, JF

Computed

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Research Profile

Latest Publications

1.
2004

Power J. F.; Fu S. W.

Dual Beam Light Profile Microscopy: A New Technique for Optical Absorption Depth Profilometry
Appl. Spectrosc. 58, 166 (2004)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Qc, H3A 2K6 Canada
2.
2004

Fu S. W.; Power J. F.

Broadband Light Profile Microscopy: A Rapid and Direct Method for Thin Film Depth Imaging
Appl. Spectrosc. 58, 96 (2004)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Qc, H3A 2K6 Canada
3.
2003

Power J. F.; Fu S. W.; Nepotchatykh O. V.

Mirage effect spectrometry and light profile microscopy: Two views of an optical depth profile (abstract)
Rev. Sci. Instrum. 74, 536 (2003)
Department of Chemistry, McGill University, 801 Sherbrooke Street, W, Montreal, Quebec H3A 2K6 Canada;

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All Publications

1.
2004

Power J. F.; Fu S. W.

Dual Beam Light Profile Microscopy: A New Technique for Optical Absorption Depth Profilometry
Appl. Spectrosc. 58, 166 (2004)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Qc, H3A 2K6 Canada
2.
2004

Fu S. W.; Power J. F.

Broadband Light Profile Microscopy: A Rapid and Direct Method for Thin Film Depth Imaging
Appl. Spectrosc. 58, 96 (2004)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Qc, H3A 2K6 Canada
3.
2003

Power J. F.; Fu S. W.; Nepotchatykh O. V.

Mirage effect spectrometry and light profile microscopy: Two views of an optical depth profile (abstract)
Rev. Sci. Instrum. 74, 536 (2003)
Department of Chemistry, McGill University, 801 Sherbrooke Street, W, Montreal, Quebec H3A 2K6 Canada;
4.
2003

Power J. F.

Depth profiling the optical absorption and thermal reflection coefficient via an analysis based on the method of images (abstract)
Rev. Sci. Instrum. 74, 362 (2003)
Department of Chemistry, McGill University, 801 Sherbrooke Street W., Montreal, Quebec H3A 2K6, Canada;
5.
2002

Power J. F.

Inverse problem theory in the optical depth profilometry of thin films
Rev. Sci. Instrum. 73, 4057 (2002)
Department of Chemistry, McGill University, 801 Sherbrooke Street West, Montreal, Quebec H3A 2K6, Canada;
6.
2000

Power J. F.; Nepotchatykh O. V.; Fu S.-W.

Evaluation of mirage effect spectrometry for optical absorption depth profiling of photodegradation in thin poly(vinylchloride) films
Appl. Spectrosc. 54, 1782 (2000)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec, H3A 2K6, Canada;
7.
2000

Karanicolas J.; Fu S.-W.; Power J. F.

Method-of-images formulation of the inverse problem of depth profiling the thermal reflection coefficient in an impulse heated solid
AIP Conf. Proc. 509, 595 (2000)
Department of Chemistry, McGill University, 801 Sherbrooke Street West, Montreal, Quebec, H3A 2K6, Canada;
8.
2000

Fu S.-W.; Power J. F.; Nepotchatykh O. V.

Optical absorption depth profiling of photodegraded poly(vinylchloride) (PVC) films by quantitative photothermal deflection technique
AIP Conf. Proc. 509, 1881 (2000)
Department of Chemistry, McGill University, 801 Sherbrooke Street West, Montreal, Quebec, H3A 2K6, Canada;
9.
2000

Fu S. W.; Power J. F.

Depth profiling of optical absorption in thin films via the mirage effect and a new inverse scattering theory. Part II: Experimental reconstructions on well-characterized materials
Appl. Spectrosc. 54, 127 (2000)
Department of Chemistry, McGill University, 801 Sherbrooke Street West, Montreal, Qc, H3A 2K6, Canada;
10.
2000

Power J. F.; Fu S. W.; Schweitzer M. A.

Depth profiling of optical absorption in thin films via the mirage effect and a new inverse scattering theory. Part I: Principles and methodology
Appl. Spectrosc. 54, 110 (2000)
Department of Chemistry, McGill University, 801 Sherbrooke Street West, Montreal, Qc, H3A 2K6, Canada;
11.
1999

Power J. F.; Fu S. W.

Longitudinal light profile microscopy: A new method for seeing below the surfaces of thin-film materials
Appl. Spectrosc. 53, 1507 (1999)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec, H3A 2K6, Canada;
12.
1999

Power J. F.; Karanicolas J.

Depth profiling of the thermal diffusivity of an opaque solid: Formulation of the inverse problem based on perturbation theory
AIP Conf. Proc. 463, 43 (1999)
Department of Chemistry, McGill University, Montreal, Quebec, H3A 2K6, Canada;
13.
1999

Power J. F.

A survey of current issues in inverse problem theory as applied to thermal wave imaging
AIP Conf. Proc. 463, 3 (1999)
Department of Chemistry, McGill University, Montreal, Quebec, H3A 2K6, Canada;
14.
1999

Schweitzer M. A.; Power J. F.

Depth dependent reconstructions of optical density in thin films via the mirage effect and an inverse scattering solution based on diffraction theory
AIP Conf. Proc. 463, 190 (1999)
Department of Chemistry, McGill University, Montreal, Quebec, H3A 2K6, Canada;
15.
1997

Power Joan F.; Schweitzer M. A.

Diffraction theory of the impulse mirage effect
Opt. Eng. 36, 521 (1997)
McGill University Department of Chemistry 801 Sherbrooke Street West Montreal, Quebec H3A 2K6, Canada power@omc.lan.mcgill.ca ;
16.
1997

Power Joan F.

Expectation minimum—a new principle of inverse problem theory in the photothermal sciences; theoretical characterization of expectation values
Opt. Eng. 36, 487 (1997)
McGill University Department of Chemistry 801 Sherbrooke Street West Montreal, Quebec, H3A 2K6, Canada power@omc.lan.mcgill.ca ;
17.
1996

Power J. F.

Sensitive interferometric video thermal wave imager
Rev. Sci. Instrum. 67, 2304 (1996)
Department of Chemistry, McGill University, Montreal P.Q. H3A 2K6, Canada
18.
1995

Power J. F.; Prystay M. C.

Nondestructive optical depth profiling in thin films through robust inversion of the laser photopyroelectric effect impulse response
Appl. Spectrosc. 49, 725 (1995)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
19.
1995

Power J. F.; Prystay M. C.

Expectation minimum (EM): A new principle for the solution of ill‐posed problems in photothermal science
Appl. Spectrosc. 49, 709 (1995)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
20.
1994

Schweitzer M. A.; Power J. F.

Optical depth profiling of thin films by impulse mirage effect spectroscopy. Part II: Measurements using wide‐band modulated excitation
Appl. Spectrosc. 48, 1076 (1994)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
21.
1994

Schweitzer M. A.; Power J. F.

Optical depth profiling of thin films by impulse mirage effect spectroscopy. Part I: Theory
Appl. Spectrosc. 48, 1054 (1994)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
22.
1993

Prystay M. C.; Power J. F.

Thermophysical measurements and interfacial adhesion studies in ultrathin polymer films using homodyne photothermal spectrometry
Appl. Spectrosc. 47, 501 (1993)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
23.
1993

Power J. F.; Prystay M. C.

Rapid recovery of wide‐bandwidth photothermal signals via homodyne photothermal spectrometry; Theory and methodology
Appl. Spectrosc. 47, 489 (1993)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
24.
1992

Webb Douglas P.; Power Joan F.; Salin Eric D.

ICP sample matrix identification by acoustic signature
Appl. Spectrosc. 46, 1362 (1992)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, P.Q., H3A 2K6 Canada
25.
1991

Power J. F.

Impulse photopyroelectric depth profiling of multilayers. Part II: Experiments with amplitude‐ and phase‐modulated wideband spectrometry
Appl. Spectrosc. 45, 1252 (1991)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada;
26.
1991

Power J. F.

Impulse photopyroelectric depth profiling of multilayers. Part I: Theory
Appl. Spectrosc. 45, 1240 (1991)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
27.
1990

Power J. F.

Frequency modulation time delay thermal lens effect spectrometry: a new technique of transient photothermal calorimetry
Appl. Opt. 29, 841 (1990)
McGill University, Chemistry Department, Montreal, Quebec H3A 2K6, Canada
28.
1990

Power J. F.

Amplitude and phase modulation (AM‐PM) wide‐band photothermal spectrometry. I. Theory
Rev. Sci. Instrum. 61, 90 (1990)
Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec, H3A 2K6 Canada
29.
1990

Power J. F.

Amplitude and phase‐modulation (AM‐PM) wide‐band photothermal spectrometry. II. Experiment
Rev. Sci. Instrum. 61, 101 (1990)
McGill University, Department of Chemistry, Montreal, Quebec H3A 2K6, Canada
30.
1990

Power J. F.

Pulsed mode thermal lens effect detection in the near field via thermally induced probe beam spatial phase modulation: a theory
Appl. Opt. 29, 52 (1990)
McGill University, Chemistry Department, Montreal, Quebec H3A 2K6, Canada
31.
1988

Power Joan F.; Mandelis Andreas

Frequency‐modulated impulse response photothermal detection through optical reflectance. 2; Experimental
Appl. Opt. 27, 3408 (1988)
McGill University, Chemistry Department
32.
1988

Mandelis Andreas; Power Joan F.

Frequency‐modulated impulse response photothermal detection through optical reflectance. 1; Theory
Appl. Opt. 27, 3397 (1988)
University of Toronto, Department of Mechanical Engineering, Photoacoustic & Photothermal Sciences Laboratory, Toronto, Ontario M5S 1A5, Canada;
33.
1987

Power Joan F.; Mandelis Andreas

Photopyroelectric thin‐film instrumentation and impulse‐response detection. Part III; Performance and signal recovery techniques
Rev. Sci. Instrum. 58, 2033 (1987)
Photoacoustic and Photothermal Sciences Laboratory, Department of Mechanical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada
34.
1987

Power Joan F.; Mandelis Andreas

Photopyroelectric thin‐film instrumentation and impulse‐response detection. Part II; Methodology
Rev. Sci. Instrum. 58, 2024 (1987)
Photoacoustic and Photothermal Sciences Laboratory, Department of Mechanical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada
35.
1987

Power Joan F.; Mandelis Andreas

Photopyroelectric thin‐film instrumentation and impulse‐response detection. Part I; A theoretical model
Rev. Sci. Instrum. 58, 2018 (1987)
Photoacoustic and Photothermal Sciences Laboratory, Department of Mechanical Engineering, University of Toronto, Toronto, Ontario M5S 1A4, Canada

Co-authors

Co-publications
9

Fu, S.-W.
5

Mandelis, Andreas
3

Nepotchatykh, Oleg
2

Schweitzer, MA
1

Salin, Eric D.