Hong Augustin J.; Kim Jiyoung; Kim Kyoungwhan; Wang Yong; Xiu Faxian; Jeon Jaeseok; Park Jemin; Rauda Iris; Chen Li-Min; Yang Yang; Tolbert Sarah; Zou Jin; Wang Kang L.
Cr metal thin film memory
J. Appl. Phys. 110, 054504 (2011)
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA